Search results
IEEE Electron Device Letters > 2018 > 39 > 1 > 111 - 114
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3904 - 3911
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3816 - 3821
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3459 - 3465
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3470 - 3475
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3063 - 3070
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 3 > 516 - 527
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 593 - 598
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4388 - 4394
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3278 - 3283
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3128 - 3134
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1808 - 1813
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1774 - 1778
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 2 > 650 - 663
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 675 - 683
IEEE Electron Device Letters > 2015 > 36 > 10 > 991 - 993
IEEE Transactions on Neural Networks and Learning Systems > 2015 > 26 > 10 > 2596 - 2601
IEEE Transactions on Electron Devices > 2015 > 62 > 8 > 2390 - 2395
IEEE Transactions on Nanotechnology > 2015 > 14 > 4 > 633 - 637
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 191 - 197