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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1236 - 1249
2016 IEEE International Electron Devices Meeting (IEDM) > 11.5.1 - 11.5.4
IEEE Electron Device Letters > 2016 > 37 > 1 > 31 - 34
IEEE Electron Device Letters > 2015 > 36 > 11 > 1142 - 1145
IEEE Journal of Solid-State Circuits > 2015 > 50 > 11 > 2786 - 2795
IEEE Transactions on Magnetics > 2015 > 51 > 11 > 1 - 7
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2966 - 2971
IEEE Journal of Solid-State Circuits > 2014 > 49 > 1 > 140 - 153
IEEE Electron Device Letters > 2014 > 35 > 5 > 539 - 541
IEEE Electron Device Letters > 2013 > 34 > 2 > 235 - 237
IEEE Electron Device Letters > 2013 > 34 > 1 > 51 - 53
2012 International Electron Devices Meeting > 2.8.1 - 2.8.4
2012 IEEE International Reliability Physics Symposium (IRPS) > ME.3.1 - ME.3.6
IEEE Transactions on Electron Devices > 2012 > 59 > 8 > 2277 - 2280