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A performance-evaluation simulator, such as a cycle-accurate simulator, is a key tool for exploring appropriate asynchronous Network-on-Chip (NoC) architectures in early stages of VLSI design, but its accuracy is insufficient in practical VLSI implementation. In this paper, a highly accurate performance-evaluation simulator based on a delay-aware model is proposed for implementing an appropriate asynchronous...
As we approach serious scaling roadblocks in the next few process nodes, it is imperative to identify new emerging technologies that can complement or supplant CMOS in the future. We present an integrated cyclic approach to explore new interconnect technologies in the nanometer era for many core systems, where on-chip interconnects are jointly optimized at all the levels in the design hierarchy to...
Software-based self-test (SBST) is increasingly used for testing processor cores embedded in SoCs, mainly because it allows at-speed, low-cost testing, while requiring limited (if any) hardware modifications to the original design. However, the method requires effective techniques for generating suitable test programs and for monitoring the results. In the case of processor core testing, a particularly...
In this work, the bulk-gate controlled circuit to improve the power supply ripple ratio (PSRR) of a Low Dropout Regulator (LDO) which deteriorates due to lowering power consumption is proposed. Designing with 0.25 mum CMOS process, the simulation results by HSPICE shown that the proposed circuit provides a high performance of PSRR even though 1/10 of the power consumption is reduced compare to the...
The challenges of deriving early-adopter competitive advantage, even with fabless access to process technology, through leveraging features offered by the advanced, and possibly disruptive, process technologies in real SoC products, are outlined. A structured methodology for addressing these challenges, and bridging the gap between process and design, sufficiently early in the development cycle to...
The dramatic increase in leakage current, coupled with the swell in process variability in nano-scaled CMOS technologies, has become a major issue for future IC design. Moreover, due to the spread of leakage power values, leakage variability cannot be neglected anymore. In this work an accurate analytic estimation and modeling methodology has been developed for logic gates leakage under statistical...
This paper presents an innovative structure based on 3 dimensional integration technology, where ultra thin inter layer dielectric enables a dynamic threshold voltage (VTH) control. A sequential process flow is proposed to fabricate 3D devices with dynamically tunable VTH. This ability can be exploited to design SRAMs cells with increased stability and surface density compared to planar technology...
The power consumption and the matching will be the principal issues at the 32 nm node and below. In this context, Ultra-Thin Body devices are extensively studied for the end-of-roadmap CMOS. In this paper we present the SON technology, leading to the simple fabrication of sustained mono-Si nano-membranes over an empty tunnel, and discuss on the application of this process to build-up electronic devices...
Advances in micromachining technology can facilitate the integration of SAW (Surface Acoustic Wave) devices and CMOS circuitry on IC scale substrate for Monolithic fabrication. The optimal design and performance of these filters can be reached by using new Smart materials. The key component in the structure of the SAW device is the piezoelectric materials used which depends mainly on some important...
A stand-alone design automation tool tailored for radio frequency (RF) complementary metal-oxide-semiconductor (CMOS) low-noise amplifier (LNA) designs is presented. Rather than relying on commercially available circuit simulators such as Spectre or Hspice, the presented synthesis tool is self-contained with its own built-in modules for faster optimization. Foundry-provided silicon-verified RF device...
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