Search results
IEEE Transactions on Industrial Electronics > 2018 > 65 > 1 > 636 - 644
IEEE Transactions on Circuits and Systems II: Express Briefs > 2018 > 65 > 1 > 91 - 95
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3390 - 3400
IEEE Communications Letters > 2017 > 21 > 11 > 2348 - 2351
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 10 > 2817 - 2827
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 8 > 972 - 976
IEEE Transactions on Computers > 2017 > 66 > 8 > 1407 - 1420
IEEE Computer Architecture Letters > 2017 > 16 > 2 > 162 - 165
IEEE Computer Architecture Letters > 2017 > 16 > 2 > 115 - 118
IEEE Transactions on Information Forensics and Security > 2017 > 12 > 7 > 1515 - 1528
IEEE Computer Architecture Letters > 2017 > 16 > 2 > 132 - 135
IEEE Journal of Radio Frequency Identification > 2017 > 1 > 2 > 195 - 201
IEEE Embedded Systems Letters > 2017 > 9 > 2 > 41 - 44
IEEE Embedded Systems Letters > 2017 > 9 > 2 > 37 - 40
IEEE Transactions on Computers > 2017 > 66 > 4 > 647 - 660
IEEE Consumer Electronics Magazine > 2017 > 6 > 2 > 118 - 124
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1329 - 1341
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 3 - 11
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 3 > 1032 - 1043
IEEE Transactions on Nuclear Science > 2017 > 64 > 2 > 874 - 881