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IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 199 - 206
IEEE Transactions on Biomedical Engineering > 2017 > 64 > 10 > 2450 - 2461
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 9 > 3188 - 3199
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2155 - 2160
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 229 - 244
IEEE Access > 2017 > 5 > 24353 - 24367
IEEE Access > 2017 > 5 > 13654 - 13664
IEEE Access > 2017 > 5 > 13346 - 13363
IEEE Transactions on Parallel and Distributed Systems > 2017 > 28 > 1 > 16 - 28
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 10 > 3151 - 3162
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3620 - 3626
IEEE Electron Device Letters > 2016 > 37 > 9 > 1219 - 1222
IEEE Transactions on Communications > 2016 > 64 > 6 > 2563 - 2577
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 5 > 1688 - 1701
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 101 - 104
IEEE Communications Magazine > 2016 > 54 > 1 > 68 - 75
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 3 > 756 - 766
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 474 - 477
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3825 - 3831
IEEE Wireless Communications > 2015 > 22 > 5 > 83 - 89