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IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 236 - 245
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3298 - 3304
2011 International Reliability Physics Symposium > SE.4.1 - SE.4.4
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 800 - 807
2010 International Electron Devices Meeting > 3.2.1 - 3.2.4
2010 IEEE International Reliability Physics Symposium > 1099 - 1104
IEEE Electron Device Letters > 2010 > 31 > 9 > 909 - 911
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1924 - 1932
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 338 - 346
IEEE Electron Device Letters > 2010 > 31 > 9 > 930 - 932
IEEE Transactions on Electron Devices > 2010 > 57 > 8 > 1737 - 1742