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Real-time failure monitoring system for IGBT module was demonstrated under 500 A power cycling test. The system successfully captured internal phenomena occurred in interface regions of the device under test. Moreover, we proposed realtime failure analysis method by combining the real-time monitoring and image processing techniques. This failure analysis method enables to distinguish the place where...
In order to predict the reliability of the product with high reliability and long life, the accelerated degradation test (ADT) is commonly applied. However, in the studies of optimizing the ADT plans, there is nearly no researches on how to select the test stress levels. In this paper, the drift Brownian motion is selected as the degradation model. The optimization of the selection of the stress levels...
Life prediction is one of the newly arisen key technology for promoting the reliability and quality of electronic products. But, the effect of the prevalent life prediction methods is not satisfactory; most of them are on the stage of theoretical research and lack of engineering practicability. In this paper, a methodology of life prediction based on accelerated degradation testing is introduced....
In this work a general concept for accelerated aging of linear analog circuit blocks is proposed. Due to the interaction of diverse aging mechanisms, circuit behavior in an arbitrary effect accelerated stress setup may show large deviation to the aging under nominal circuit conditions. The proposed analytical small signal analysis proves to be a fast and easy way to obtain the contributions of all...
This paper presents a stochastic degradation model for the residual life prediction of monitored plants using an adapted Brownian motion based approach with a drifting parameter. This model differs from other Brownian motion based approaches in that the drifting parameter of the degradation process is adapted to the history of monitored information. This treatment is performed by Kalman filtering...
In this brief, we studied the endurance properties of an integrated phase-change line cell. The different characteristics typically observed during the endurance lifetime are described. The monitoring of the switching parameters of the cell (reset current and threshold voltage) during endurance testing could be correlated with a gradual degradation of the reset switching. The following conclusions...
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