Search results
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 7 > 812 - 816
IEEE Transactions on Emerging Topics in Computing > 2017 > 5 > 3 > 317 - 328
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 7 > 1837 - 1844
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 6 > 695 - 699
IEEE Journal of Solid-State Circuits > 2017 > 52 > 5 > 1196 - 1209
IEEE Electron Device Letters > 2017 > 38 > 5 > 690
IEEE Design & Test > 2017 > 34 > 2 > 24 - 30
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 4 > 969 - 980
IEEE Journal of Solid-State Circuits > 2017 > 52 > 2 > 448 - 459
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 12 > 3513 - 3525
IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2016 > 6 > 3 > 305 - 318
IEEE Transactions on Computers > 2016 > 65 > 8 > 2652 - 2658
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 2999 - 3004
IEEE Transactions on Computers > 2016 > 65 > 8 > 2672 - 2677
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 7 > 2570 - 2579
Journal of Lightwave Technology > 2016 > 34 > 10 > 2391 - 2397
IEEE Electron Device Letters > 2016 > 37 > 4 > 508 - 511
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 4 > 1266 - 1279
IEEE Transactions on Circuits and Systems II: Express Briefs > 2016 > 63 > 3 > 249 - 253
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 2 > 521 - 529