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IET Power Electronics > 2017 > 10 > 10 > 1208 - 1213
IEEE Transactions on Power Electronics > 2017 > 32 > 8 > 6405 - 6415
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2142 - 2147
IEEE Transactions on Industrial Electronics > 2016 > 63 > 4 > 1995 - 2004
IEEE Transactions on Industry Applications > 2016 > 52 > 2 > 1688 - 1697
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 169 - 176
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1023 - 1028
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 194 - 200
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 7 - 12
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 349 - 357
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2094 - 2103
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 157 - 163
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 131 - 140
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 540 - 546
IEEE Electron Device Letters > 2011 > 32 > 3 > 294 - 296
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 290 - 294
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1197 - 1204
IEEE Electron Device Letters > 2011 > 32 > 4 > 479 - 481
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 126 - 130
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 92 - 97