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IEEE Electron Device Letters > 2018 > 39 > 1 > 4 - 7
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4430 - 4434
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4393 - 4399
Electronics Letters > 2017 > 53 > 18 > 1279 - 1281
IEEE Electron Device Letters > 2017 > 38 > 8 > 1015 - 1018
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 164 - 169
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 3 - 10
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 4685 - 4692
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 4617 - 4623
2016 IEEE International Electron Devices Meeting (IEDM) > 7.5.1 - 7.5.4
2016 IEEE International Electron Devices Meeting (IEDM) > 5.2.1 - 5.2.4
2016 IEEE International Electron Devices Meeting (IEDM) > 30.1.1 - 30.1.4
IEEE Electron Device Letters > 2016 > 37 > 11 > 1391 - 1394
IEEE Transactions on Semiconductor Manufacturing > 2016 > 29 > 4 > 355 - 362
Electronics Letters > 2016 > 52 > 22 > 1869 - 1871