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IEEE Electron Device Letters > 2016 > 37 > 2 > 182 - 185
IEEE Electron Device Letters > 2015 > 36 > 12 > 1267 - 1270
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 2972 - 2978
2012 IEEE International Reliability Physics Symposium (IRPS) > MY.4.1 - MY.4.4
IEEE Electron Device Letters > 2010 > 31 > 4 > 287 - 289
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 116 - 122
IEEE Electron Device Letters > 2009 > 30 > 7 > 781 - 783
IEEE Electron Device Letters > 2009 > 30 > 2 > 152 - 154
Microelectronic Engineering > 2007 > 84 > 9-10 > 2394-2397