Search results
IEEE Electron Device Letters > 2018 > 39 > 1 > 127 - 130
IEEE Electron Device Letters > 2018 > 39 > 1 > 111 - 114
IEEE Journal of the Electron Devices Society > 2017 > 5 > 6 > 496 - 503
IEEE Electron Device Letters > 2017 > 38 > 9 > 1339 - 1342
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3816 - 3821
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3498 - 3501
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3470 - 3475
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1020 - 1025
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 593 - 598
IEEE Electron Device Letters > 2017 > 38 > 1 > 32 - 35
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 360 - 369
IEEE Transactions on Nanotechnology > 2016 > 15 > 3 > 549 - 556
IEEE Electron Device Letters > 2016 > 37 > 6 > 770 - 773
IEEE Transactions on Electron Devices > 2015 > 62 > 12 > 4220 - 4224
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3820 - 3824
IEEE Electron Device Letters > 2015 > 36 > 10 > 1097 - 1100
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2878 - 2882
IEEE Journal of the Electron Devices Society > 2015 > 3 > 5 > 405 - 409
Proceedings of the IEEE > 2015 > 103 > 4 > 567 - 582
IEEE Electron Device Letters > 2014 > 35 > 7 > 795 - 797