Search results
IEEE Electron Device Letters > 2018 > 39 > 1 > 63 - 66
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5230 - 5235
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4260 - 4265
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 10 > 1162 - 1166
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3836 - 3840
IEEE Transactions on Semiconductor Manufacturing > 2017 > 30 > 3 > 236 - 242
IEEE Microwave and Wireless Components Letters > 2017 > 27 > 6 > 575 - 577
IEEE Transactions on Power Electronics > 2017 > 32 > 5 > 3935 - 3945
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 4 > 387 - 391
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1455 - 1466
IEEE Transactions on Nuclear Science > 2017 > 64 > 3 > 976 - 982
IEEE Electron Device Letters > 2017 > 38 > 2 > 191 - 194
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 427 - 431
IEEE Electron Device Letters > 2017 > 38 > 1 > 32 - 35
IEEE Transactions on Nuclear Science > 2017 > 64 > 6-2 > 1549 - 1553
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 1 > 61 - 65
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4279 - 4287
IEEE Electron Device Letters > 2016 > 37 > 11 > 1434 - 1437
IEEE Electron Device Letters > 2016 > 37 > 11 > 1489 - 1492
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3445 - 3450