Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3413 - 3420
IEEE Transactions on Plasma Science > 2017 > 45 > 4-2 > 631 - 635
IEEE Transactions on Plasma Science > 2016 > 44 > 10-1 > 2272 - 2277
IEEE Transactions on Dielectrics and Electrical Insulation > 2016 > 23 > 1 > 58 - 60
IEEE Transactions on Dielectrics and Electrical Insulation > 2015 > 22 > 6 > 3299 - 3304
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3837 - 3843
IEEE Transactions on Plasma Science > 2015 > 43 > 10-2 > 3626 - 3636
IEEE Transactions on Plasma Science > 2015 > 43 > 2 > 587 - 593
IEEE Transactions on Plasma Science > 2015 > 43 > 1-3 > 422 - 432
IEEE Transactions on Plasma Science > 2014 > 42 > 10-2 > 2974 - 2980
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2547 - 2551
IEEE Transactions on Dielectrics and Electrical Insulation > 2014 > 21 > 4 > 1950 - 1956
IEEE Transactions on Nuclear Science > 2014 > 61 > 2 > 830 - 836
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-2 > 2082 - 2089
IEEE Transactions on Plasma Science > 2012 > 40 > 8 > 2094 - 2098
IEEE Transactions on Electron Devices > 2012 > 59 > 10 > 2832 - 2837
IEEE Transactions on Plasma Science > 2012 > 40 > 9 > 2267 - 2273
IEEE Transactions on Plasma Science > 2011 > 39 > 4-1 > 980 - 987
IEEE Transactions on Dielectrics and Electrical Insulation > 2011 > 18 > 4 > 1268 - 1273
IEEE Transactions on Dielectrics and Electrical Insulation > 2011 > 18 > 3 > 924 - 928