Search results
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 182 - 195
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 122 - 128
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3473 - 3483
IEEE Transactions on Reliability > 2017 > 66 > 4 > 966 - 979
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3341 - 3354
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4486 - 4491
IEEE Electron Device Letters > 2017 > 38 > 11 > 1532 - 1535
IEEE Journal of Solid-State Circuits > 2017 > 52 > 10 > 2769 - 2785
IEEE Journal of Solid-State Circuits > 2017 > 52 > 10 > 2589 - 2600
IEEE Transactions on Parallel and Distributed Systems > 2017 > 28 > 10 > 2896 - 2910
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 9 > 1458 - 1470
Proceedings of the IEEE > 2017 > 105 > 9 > 1822 - 1833
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 481 - 489
Proceedings of the IEEE > 2017 > 105 > 9 > 1650 - 1665
IEEE Design & Test > 2017 > 34 > 4 > 60 - 68
IEEE Transactions on Consumer Electronics > 2017 > 63 > 3 > 216 - 224
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 8 > 2220 - 2233
IEEE Transactions on Computers > 2017 > 66 > 8 > 1293 - 1301
IEEE Computer Architecture Letters > 2017 > 16 > 2 > 153 - 157
IEEE Transactions on Computers > 2017 > 66 > 7 > 1274 - 1280