Search results
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 37 - 49
IEEE Journal of Solid-State Circuits > 2018 > 53 > 1 > 91 - 101
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3138 - 3151
IEEE Transactions on Biomedical Circuits and Systems > 2017 > 11 > 5 > 1087 - 1096
IEEE Transactions on Biomedical Circuits and Systems > 2017 > 11 > 2 > 446 - 454
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 4 > 377 - 381
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1674 - 1682
IEEE Transactions on Biomedical Circuits and Systems > 2016 > 10 > 6 > 1143 - 1151
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 6 > 2184 - 2194
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 4 > 1351 - 1360
IEEE Sensors Journal > 2016 > 16 > 23 > 8589 - 8596
IEEE Journal of Solid-State Circuits > 2015 > 50 > 11 > 2475 - 2490
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 9 > 1951 - 1955
IEEE Transactions on Biomedical Circuits and Systems > 2015 > 9 > 2 > 237 - 247
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 255 - 261
IEEE Transactions on Nuclear Science > 2014 > 61 > 3-2 > 1444 - 1450
IEEE Transactions on Magnetics > 2014 > 50 > 11 > 1 - 4
IEEE Journal of Solid-State Circuits > 2014 > 49 > 11 > 2730 - 2739
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 12 > 2286 - 2294