Search results
IEEE Electron Device Letters > 2017 > 38 > 6 > 786 - 789
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1278 - 1283
IEEE Transactions on Nuclear Science > 2013 > 60 > 1-2 > 402 - 407
IEEE Electron Device Letters > 2013 > 34 > 2 > 151 - 153
IEEE Electron Device Letters > 2013 > 34 > 3 > 360 - 362
IEEE Transactions on Electron Devices > 2012 > 59 > 6 > 1653 - 1660
IEEE Electron Device Letters > 2012 > 33 > 10 > 1366 - 1368
IEEE Transactions on Electron Devices > 2012 > 59 > 10 > 2582 - 2588
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3651 - 3654
IEEE Electron Device Letters > 2012 > 33 > 9 > 1255 - 1257
IEEE Electron Device Letters > 2012 > 33 > 10 > 1339 - 1341
IEEE Transactions on Electron Devices > 2012 > 59 > 10 > 2589 - 2596
IEEE Electron Device Letters > 2012 > 33 > 4 > 468 - 470
IEEE Electron Device Letters > 2011 > 32 > 4 > 461 - 463
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 617 - 622
IEEE Electron Device Letters > 2011 > 32 > 2 > 146 - 148
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 107 - 114
IEEE Electron Device Letters > 2011 > 32 > 4 > 449 - 451
IEEE Electron Device Letters > 2011 > 32 > 4 > 488 - 490
IEEE Electron Device Letters > 2011 > 32 > 5 > 686 - 688