Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2635 - 2642
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 1392 - 1396
IEEE Transactions on Electron Devices > 2015 > 62 > 6 > 1746 - 1753
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 1 > 136 - 145
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 7 > 1639 - 1644
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 2 > 280 - 285
IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3838 - 3844
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 127 - 132
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 2 > 340 - 349
IEEE Transactions on Applied Superconductivity > 2013 > 23 > 3-1 > 1701405
IEEE Transactions on Neural Systems and Rehabilitation Engineering > 2013 > 21 > 4 > 634 - 647
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 12 > 2226 - 2239
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2013 > 32 > 3 > 367 - 380
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 5 > 958 - 970
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 8 > 1558 - 1562
IEEE Transactions on Electromagnetic Compatibility > 2013 > 55 > 2 > 395 - 406
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 3 > 443 - 453
IEEE Transactions on Nanotechnology > 2013 > 12 > 1 > 57 - 70
IEEE Transactions on Circuits and Systems I: Regular Papers > 2013 > 60 > 2 > 290 - 302