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IEEE Transactions on Applied Superconductivity > 2018 > 28 > 3 > 1 - 5
IEEE Transactions on Electromagnetic Compatibility > 2018 > 60 > 1 > 107 - 114
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3588 - 3594
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 7 > 1781 - 1790
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 6 > 899 - 912
IEEE Transactions on Industrial Electronics > 2017 > 64 > 6 > 4741 - 4750
IEEE Transactions on Nanotechnology > 2017 > 16 > 3 > 514 - 522
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 4 > 521 - 536
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 4 > 1051 - 1057
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 52 - 58
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1261 - 1268
IEEE Transactions on Industrial Electronics > 2017 > 64 > 2 > 1284 - 1291
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 441 - 448
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4823 - 4830
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 12 > 3468 - 3476
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 10 > 1681 - 1694
IEEE Transactions on Plasma Science > 2016 > 44 > 10-1 > 2232 - 2239
IEEE Transactions on Plasma Science > 2016 > 44 > 9-2 > 1842 - 1846
IEEE Transactions on Circuits and Systems II: Express Briefs > 2016 > 63 > 8 > 748 - 752
IEEE Transactions on Circuits and Systems I: Regular Papers > 2016 > 63 > 8 > 1255 - 1264