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IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2242 - 2247
IEEE Transactions on Electron Devices > 2013 > 60 > 12 > 4146 - 4151
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 391 - 398
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2242 - 2247
IEEE Transactions on Electron Devices > 2013 > 60 > 12 > 4146 - 4151
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 391 - 398