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IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 236 - 245
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3298 - 3304
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 800 - 807
IEEE Electron Device Letters > 2010 > 31 > 9 > 909 - 911
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1924 - 1932
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 338 - 346
IEEE Electron Device Letters > 2010 > 31 > 9 > 930 - 932
IEEE Transactions on Electron Devices > 2010 > 57 > 8 > 1737 - 1742
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 3232 - 3235
IEEE Transactions on Electron Devices > 2009 > 56 > 4 > 601 - 608
IEEE Transactions on Electron Devices > 2008 > 55 > 3 > 743 - 753
IEEE Electron Device Letters > 2008 > 29 > 7 > 795 - 798
IEEE Electron Device Letters > 2007 > 28 > 7 > 646 - 648
IEEE Electron Device Letters > 2007 > 28 > 7 > 637 - 639
IEEE Electron Device Letters > 2007 > 28 > 9 > 834 - 836