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Metrology and Measurement Systems > 2020 > Vol. 27, nr 4 > 615--624
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1425 - 1432
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1598 - 1604
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1391 - 1396
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1441 - 1445
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1139 - 1145
Engineering Science and Technology, an International Journal > 2016 > 19 > 4 > 1993-2001
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1369 - 1372
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1779 - 1784
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1378 - 1382
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1390 - 1397
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1520 - 1526
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1709 - 1715
IEEE Transactions on Electromagnetic Compatibility > 2015 > 57 > 2 > 158 - 163
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 1 > 184 - 189