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Microwave and Optical Technology Letters > 63 > 3 > 758 - 763
physica status solidi (a) > 217 > 7 > n/a - n/a
Optical and Quantum Electronics > 2018 > 50 > 12 > 1-13
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 59 - 63
Microelectronics Reliability > 2018 > 80 > C > 257-265
physica status solidi (RRL) – Rapid Research Letters > 11 > 7 > n/a - n/a
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 73 - 77
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 213 - 219
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1486 - 1494
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 3 > 756 - 766
IEEE Electron Device Letters > 2015 > 36 > 10 > 1011 - 1014
IEEE Transactions on Electron Devices > 2015 > 62 > 8 > 2549 - 2554
Microelectronics Reliability > 2014 > 54 > 9-10 > 2227-2231
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 1987 - 1992
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1316 - 1320
IEEE Transactions on Electron Devices > 2013 > 60 > 12 > 4125 - 4132
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 2 > 357 - 361
IEEE Journal of Quantum Electronics > 2012 > 48 > 9 > 1169 - 1176
IEEE Electron Device Letters > 2012 > 33 > 5 > 658 - 660