Search results
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 45 - 50
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 59 - 63
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4868 - 4874
IEEE Electron Device Letters > 2017 > 38 > 10 > 1413 - 1416
IEEE Electron Device Letters > 2017 > 38 > 10 > 1445 - 1448
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4065 - 4070
IEEE Electron Device Letters > 2017 > 38 > 9 > 1298 - 1301
IEEE Electron Device Letters > 2017 > 38 > 9 > 1294 - 1297
IEEE Electron Device Letters > 2017 > 38 > 9 > 1305 - 1308
IEEE Electron Device Letters > 2017 > 38 > 8 > 1094 - 1096
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3114 - 3119
IEEE Electron Device Letters > 2017 > 38 > 6 > 771 - 774
IEEE Electron Device Letters > 2017 > 38 > 5 > 657 - 660
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1498 - 1504
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1505 - 1510
IEEE Electron Device Letters > 2017 > 38 > 1 > 83 - 86
IEEE Sensors Journal > 2016 > 16 > 18 > 6828 - 6838
IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 246 - 252
IEEE Transactions on Nuclear Science > 2016 > 63 > 4-1 > 1995 - 2001
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 2219 - 2222