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IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1134 - 1140
IEEE Electron Device Letters > 2011 > 32 > 4 > 569 - 571
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 547 - 552
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2127 - 2134
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 92 - 97
IEEE Electron Device Letters > 2011 > 32 > 3 > 288 - 290
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 631 - 640
IEEE Electron Device Letters > 2010 > 31 > 11 > 1263 - 1265
IEEE Transactions on Electron Devices > 2010 > 57 > 10 > 2410 - 2417
IEEE Electron Device Letters > 2010 > 31 > 12 > 1404 - 1406
IEEE Transactions on Electron Devices > 2010 > 57 > 9 > 2258 - 2263
IEEE Electron Device Letters > 2010 > 31 > 8 > 869 - 871
IEEE Transactions on Electron Devices > 2010 > 57 > 8 > 1809 - 1819
IEEE Electron Device Letters > 2010 > 31 > 1 > 80 - 82
Journal of Microelectromechanical Systems > 2010 > 19 > 1 > 162 - 174
IEEE Transactions on Electron Devices > 2010 > 57 > 9 > 2047 - 2056
IEEE Transactions on Electron Devices > 2010 > 57 > 3 > 690 - 695
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 2925 - 2934
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3210 - 3217
IEEE Transactions on Electron Devices > 2009 > 56 > 1 > 100 - 108