Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2298 - 2305
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 832 - 839
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1853 - 1860
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3071 - 3078
IEEE Electron Device Letters > 2012 > 33 > 7 > 961 - 963
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 933 - 940
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 672 - 676
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1134 - 1140
IEEE Electron Device Letters > 2011 > 32 > 4 > 569 - 571
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 805 - 811
IEEE Electron Device Letters > 2011 > 32 > 6 > 800 - 802
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 547 - 552
IEEE Electron Device Letters > 2011 > 32 > 4 > 449 - 451
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 126 - 130
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 118 - 125
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 92 - 97
IEEE Electron Device Letters > 2011 > 32 > 3 > 288 - 290
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 227 - 235
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 631 - 640
IEEE Electron Device Letters > 2010 > 31 > 11 > 1263 - 1265