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IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 227 - 235
IEEE Electron Device Letters > 2010 > 31 > 12 > 1404 - 1406
IEEE Transactions on Electron Devices > 2010 > 57 > 5 > 1129 - 1136
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3185 - 3191