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Combinational logic soft errors are expected to be the dominant reliability issue for advanced technologies. One of the major factors affecting the soft-error rates is single-event transient (SET) pulse widths. The SET pulse widths, which are controlled by drift, diffusion, and parasitic bipolar transistor parameters, are a strong function of operating temperature. In this work, heavy-ion induced...
An unclonable system for product authentication in anti-counterfeiting has been implemented in standard 90 nm CMOS technology. The circuit exploits the intrinsic variability of the electrical characteristics of minimum size MOSFETs, in order to generate a physical one-way function that univocally identifies each particular IC. Effects of temperature, voltage supply and process variations have been...
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