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IEEE Electron Device Letters > 2011 > 32 > 6 > 800 - 802
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 126 - 130
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 118 - 125
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 92 - 97
IEEE Electron Device Letters > 2009 > 30 > 12 > 1287 - 1289
IEEE Electron Device Letters > 2009 > 30 > 1 > 39 - 41
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 203 - 208
IEEE Transactions on Electron Devices > 2009 > 56 > 3 > 399 - 407
IEEE Transactions on Electron Devices > 2008 > 55 > 4 > 1027 - 1034
IEEE Electron Device Letters > 2008 > 29 > 2 > 171 - 173
IEEE Electron Device Letters > 2008 > 29 > 2 > 180 - 182
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 47 - 61