Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4018 - 4024
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2391 - 2397
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 352 - 358
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 229 - 235
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2243 - 2249
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1278 - 1283
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 497 - 506
IEEE Electron Device Letters > 2013 > 34 > 8 > 1053 - 1055
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 562 - 566
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 126 - 130
IEEE Transactions on Electron Devices > 2011 > 58 > 10 > 3549 - 3558
IEEE Electron Device Letters > 2010 > 31 > 5 > 440 - 442
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 203 - 208
IEEE Electron Device Letters > 2008 > 29 > 2 > 171 - 173
IEEE Electron Device Letters > 2008 > 29 > 2 > 180 - 182
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 47 - 61