Wyniki wyszukiwania
2016 IEEE International Reliability Physics Symposium (IRPS) > DI-3-1 - DI-3-5
IEEE Electron Device Letters > 2016 > 37 > 1 > 84 - 87
2011 International Reliability Physics Symposium > 6A.3.1 - 6A.3.10
IEEE Electron Device Letters > 2011 > 32 > 1 > 81 - 83
2010 IEEE International Reliability Physics Symposium > 1105 - 1114
IEEE Transactions on Electron Devices > 2009 > 56 > 2 > 267 - 274
IEEE Transactions on Electron Devices > 2009 > 56 > 2 > 236 - 242
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 222 - 230
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 22 - 34
IEEE Electron Device Letters > 2007 > 28 > 7 > 603 - 605
IEEE Transactions on Electron Devices > 2006 > 53 > 7 > 1583 - 1592