Search results
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 597 - 603
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3697 - 3702
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2243 - 2249
IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3751 - 3756
IEEE Electron Device Letters > 2012 > 33 > 3 > 339 - 341
IEEE Electron Device Letters > 2007 > 28 > 7 > 631 - 633