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IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 440 - 448
IEEE Transactions on Electron Devices > 2009 > 56 > 4 > 678 - 682
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 440 - 448
IEEE Transactions on Electron Devices > 2009 > 56 > 4 > 678 - 682