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2011 International Reliability Physics Symposium > 5A.6.1 - 5A.6.6
IEEE Transactions on Electron Devices > 2010 > 57 > 2 > 458 - 465
2011 International Reliability Physics Symposium > 5A.6.1 - 5A.6.6
IEEE Transactions on Electron Devices > 2010 > 57 > 2 > 458 - 465