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The assessment of board level solder joint reliability during thermal cycling is very important for electronic packages. During thermal cycling, the mismatch in Coefficient of Thermal Expansion (CTE) between the materials used in the package induces stress on the solder interconnects and results in deformation and stresses. Finite element tools are widely used for rapid design optimization and also...
Driven by minimized package size, cost as well as performance, wafer level package (WLCSP) is currently one of the fastest growing segments in the semiconductor packaging industry. Not as plastic BGA with a substrate interposer, WLP is a silicon chip directly mounted on printed circuit board (PCB) board. The large CTE(coefficient of thermal expansion) mismatch between silicon and organic leads to...
In this study, the drop test simulation for a typical stacked memory device with 8 units integrated vertically on board-level was performed by finite element method. The units were connected with each other through copper lead frames and assembled on the PCB by pins. The computational model of the device was built in ANSYS and the drop test of this board-level assembled device was investigated by...
In this study, the drop test simulation for a typical stacked memory device with 8 units integrated vertically on board-level was performed by finite element method. The units were connected with each other through copper lead frames and assembled on the PCB by pins. The computational model of the device was built in ANSYS and the drop test of this board-level assembled device was investigated by...
The reliability performance and structural of the solder joint on the Ball Grid Array (BGA) has become an important concern, due to increasing demand of electronic devices. The reliability of the BGA are evaluated through shear test. Different parameters of the ball shear test will cause the change on stress and strain. In this paper, a simple shear test on a single solder ball joints on Ball Grid...
Enhancing the reliability Ball grid array (BGA) is significant due major contribution as an interconnection in the electronic devices. Due to the compactness of the electronic devices, ball grid array (BGA) interconnection methods are utilized as passage to transmit power and signals within the electronic. However, the reliability of the BGA is very significant as it has a direct effect on the performance...
The dropping test of WLCSP with RDL on board-level was investigated by numerical method in this study. The asymmetric pattern of WLCSP devices mounted on the PCB board was considered. Using the finite element analysis, the stress and energy in the WLCSP with RDL was predicted under the dropping test conditions. The critical locations of WLCSP device on the PCB in the dropping test were identified...
Three dimensional finite element analysis (FEA) is performed to assess the board level temperature cycling reliability for lead-free solder Sn96.5Ag3Cu0.5 (SAC305) used in eWLB packages. With Anand viscoplastic constitutive model used for the solder material, the chosen damage parameters, i.e. accumulated creep strain or accumulated creep strain energy density, can be derived from the finite element...
This article describes recent advance in research of reliability of lead-free (SAC 305) ball interconnections between electronic modules and base printed circuit boards. Alternative methods such as finite element method, which is being widely used in simulation software Ansys and by Coffin-Manson's fatigue model. Recent calculations concur to statistic-based evaluation of earlier experiments, which...
Prevalence of portable devices such as netbook led to increased concerns on drop reliability of FBGA. In order to investigate drop reliability, board level drop test according to Jedec is done in assembly and SMT company, whereas system drop test such as netbook drop test is processed in final product company. In general, the lifetime of Jedec board level drop test and the lifetime of system drop...
A dynamic substructural method (DSM) is developed to simulate the board level drop test of a wafer level chip scale package (WL-CSP). Parametric study on package location at the test board, printed circuit board (PCB) thickness and WL-CSP package thickness is conducted in the board level drop test simulations. The peeling stress and first principle stress of the solder joints are checked and discussed...
The submodeling technique is a powerful analysis tool. The method promotes more accurate analysis and also helps enhance productivity. It has been shown that by using displacement-force cut boundary condition method, it can be made even more versatile. The local stress phenomena of the solder microbump have been solved with this approach to demonstrate the concept. From the simulation model, it is...
The effects of the moment, axial force and shear force induced during drop impact on the peeling stress of the solder joints were investigated by a 2-D beam model and a 3-D solid model of board level electronic package. It shows that the peeling stress is dominated by the bending stress and the maximum occurs at the PCB end. Results of the two models indicated that in the solder joint array only a...
In this paper, the mechanical performance of solder joints of BGA mounted on flexible printed circuit (FPC) was studied using finite element method (FEM). To optimize the electric components layout during the design, it is necessary to predict the bending reliability of components on FPC. Traditionally, 3-point or 4-point bending are common used to study if the substrate is rigid. In order to simulate...
In this paper, a comprehensive study is carried out to investigate the WLP package dynamic behaviors subjected to drop impact according to the JEDEC specification. First, a Direct Acceleration Input (DAI) method, which decouples the board dynamic responses from the test system, thus avoids the difficulties in modeling the complex behaviors of contact between the drop table and drop surfaces, is introduced...
In this paper, a wrist device conception was selected to study the reliability of flexible devices by drop test simulation. In the conception device, all of the components cannot be made flexible immediately. Some of them are still rigid, such as the ball grid array (BGA), the connector, and some other big components like the vibrator. The reliability of the device, where such rigid components are...
A beam model of board level electronic package was used to investigate effects of the moment, axial force and shear force induced during drop/impact on the peeling stress of the soldered joints. The peeling stresses in soldered joints were evaluated under static and dynamic bending of the PCB. It shows that the peeling stress is dominated by the bending stress and the maximum occurs at the PCB end...
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