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IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 422 - 431
IEEE Transactions on Nuclear Science > 2015 > 62 > 4-1 > 1682 - 1688
2015 IEEE International Reliability Physics Symposium > 2F.4.1 - 2F.4.5
IEEE Transactions on Electron Devices > 2013 > 60 > 12 > 4065 - 4072
2012 IEEE International Reliability Physics Symposium (IRPS) > 2A.2.1 - 2A.2.5
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.9.1 - XT.9.4
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 1013 - 1022
IEEE Electron Device Letters > 2012 > 33 > 12 > 1705 - 1707
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1476 - 1482
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 567 - 571
IEEE Electron Device Letters > 2011 > 32 > 12 > 1707 - 1709
2010 IEEE International Reliability Physics Symposium > 1105 - 1114
IEEE Electron Device Letters > 2010 > 31 > 8 > 788 - 790