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With the growing concerns about susceptibility of integrated circuits to electromagnetic interferences, the need for accurate prediction tools and models to reduce risks of non-compliance becomes critical for circuit designers. However, on-chip characterization of noise is still necessary for model validation. This paper presents an on-chip noise sensor dedicated to the time-domain measurement of...
An on-chip waveform capturing technique demonstrates 8.5 ENOB and 62.7 dB SFDR at 200 Ms/s for analog signals with 25-MHz bandwidth and 2.5 V rail-to-rail offset DC level, suitable for testing and self diagnosis of a mixed-signal chip. The area of 0.004mm2 in a 90 nm CMOS chip is only required for the integration of probing front end circuitry, with the help of an efficient discretization algorithm...
A continuous-time power supply noise monitoring technique features a coverage of voltage domains at Vdd as well as at Vss and multi-channel probing at more than a hundred locations on power planes in a circuit. Methods toward quality on-chip power supply noise measurements are derived. A calibration flow eliminates the offset as well as gain errors among probing channels. A combined evaluation of...
Accurate on-chip voltage measurement using direct probing is proposed. Series resistors and probing pads with floated ground are fabricated on-chip, and high-frequency probes and a digital oscilloscope is utilized off the chip. Compensation procedure of the non-ideal frequency response of the probing system is defined to improve wideband fidelity. The proposed measurement technique is experimentally...
An on-chip buck converter with 3D chip stacking is proposed and the operation is experimentally verified. The manufactured converter achieves a maximum power efficiency of 62% for an output current of 70mA with a switching frequency of 200MHz and a 2x2mm on-chip LC output filter in 0.35mum CMOS. The use of glass epoxy interposer to increase the maximum power efficiency up to 71.3%, and the power efficiency...
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