Search results
IEEE Design & Test > 2017 > 34 > 5 > 104
IEEE Transactions on Information Forensics and Security > 2016 > 11 > 10 > 2160 - 2173
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 5 > 819 - 830
IEEE Design & Test > 2017 > 34 > 5 > 104
IEEE Transactions on Information Forensics and Security > 2016 > 11 > 10 > 2160 - 2173
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 5 > 819 - 830