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2011 International Reliability Physics Symposium > XT.8.1 - XT.8.6
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1490 - 1498
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 14 - 21
2011 International Reliability Physics Symposium > XT.8.1 - XT.8.6
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1490 - 1498
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 14 - 21