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IEEE Electron Device Letters > 2017 > 38 > 6 > 705 - 707
2010 International Electron Devices Meeting > 4.7.1 - 4.7.4
2010 IEEE International Reliability Physics Symposium > 1008 - 1013
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 92 - 95
IEEE Electron Device Letters > 2010 > 31 > 5 > 408 - 410
IEEE Electron Device Letters > 2009 > 30 > 8 > 873 - 875
IEEE Electron Device Letters > 2009 > 30 > 12 > 1371 - 1373