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IEEE Electron Device Letters > 2017 > 38 > 7 > 929 - 932
IEEE Transactions on Electron Devices > 2013 > 60 > 12 > 4165 - 4172
IEEE Electron Device Letters > 2013 > 34 > 2 > 253 - 255
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 227 - 235