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In-place Polarity inVersion (IPV) has been proposed to mitigate the single event upset (SEU) induced soft errors for academic VPR FPGA architectures, and this paper extends the original IPV so that it can be used for commercial FPGA architectures. Different from the original IPV, we use a new soft error model based on signal probability and propose a simple yet effective greedy based algorithm. To...
Soft error induced reliability problem has already become a major concern for modern SRAM-based FPGAs (Field Programmable Gate Arrays) even at the ground level. In this paper, we propose a duplication-with-recovery (DWR) technique to recover the configuration bit faults on interconnects, which contribute to the majority of soft errors in FPGAs. Based on a study on the detailed routing structure in...
With increasing scale of Field Programmable Gate Arrays (FPGAs), architecture of interconnect resources (IRs) in FPGA is becoming more and more complicated. Switch matrix (SM) is one of the most important concepts in the IR architecture. Existing concept of the SM is no longer applicable to these high-end FPGAs. In this paper, based on analysis of the IR architecture in Virtex-5 FPGA, we come up with...
SRAM-based FPGAs are more and more relevant in a growing number of applications, ranging from the automotive to the aerospace ones. Designers of safety-critical applications demand accurate methodologies to evaluate the Single Event Upsets (SEUs) sensitivity of their designs. In this paper, we present an accurate simulation method for the evaluation of the effects of SEUs in the configuration memory...
Packet-based on-chip interconnection networks, or Network-on-Chips (NoCs) are progressively replacing global on-chip interconnections in Multi-processor System-on-Chips (MP-SoCs) thanks to better performances and lower power consumption. However, modern generations of MP-SoCs have an increasing sensitivity to faults due to the progressive shrinking technology. Consequently, in order to evaluate the...
SRAM-based FPGAs suffer from soft errors caused by cosmic particles. This paper introduces a new switch box architecture to mitigate soft errors. In this switch box architecture, the number of SRAM bits required for programming the switch boxes is reduced by means of switch reduction with slight impact on routing capability of the switch box. This architecture does not require any modification of...
System-on-Chip (SoC) circuits have evolved to single chip Multiprocessor systems. Due to increasing variance of process parameters, which produces synchronization problems on large SoCs, a globally-asynchronous locally-synchronous (GALS) design style must have been mobilized. In addition, the large VLSI circuits are also becoming more susceptible to transient and intermittent faults which can corrupt...
Static-random-access-memory(SRAM)-based field programmable gate arrays (FPGAs) consists of 50% ~70% routing resources. A simple programmable interconnect point (PIP) is a switch controlled by SRAM configuration cell connecting two wires. A novel traverse algorithm targeted for the detection of PIP open faults is proposed. Experimental results run on the Fudan design system (FDS) platform show that...
Due to their reconfigurability and their high density of resources, SRAM-based FPGAs are more and more used in embedded systems. For some applications (Pay-TV,Banking, Telecommunication ...), a high level of security is needed. FPGAs are intrinsically sensitive to ionizing effects, such as light stimulation, and attackers can try to exploit faults injected in the downloaded configuration. Previous...
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