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IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 290 - 297
IEEE Electron Device Letters > 2014 > 35 > 4 > 431 - 433
IEEE Transactions on Electron Devices > 2012 > 59 > 7 > 1899 - 1905
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 118 - 125
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2347 - 2353
IEEE Transactions on Circuits and Systems II: Express Briefs > 2010 > 57 > 10 > 798 - 802
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 6 > 947 - 956
IEEE Transactions on Electron Devices > 2010 > 57 > 7 > 1706 - 1709
IEEE Transactions on Electron Devices > 2010 > 57 > 2 > 429 - 436
Proceedings of the IEEE > 2009 > 97 > 10 > 1687 - 1714
IEEE Transactions on Electron Devices > 2009 > 56 > 5 > 1086 - 1093
IEEE Transactions on Semiconductor Manufacturing > 2009 > 22 > 1 > 59 - 65
IEEE Transactions on Electron Devices > 2008 > 55 > 9 > 2348 - 2353