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IEEE Electron Device Letters > 2017 > 38 > 1 > 99 - 102
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3487 - 3492
IEEE Electron Device Letters > 2016 > 37 > 4 > 385 - 388
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 69 - 74
IEEE Transactions on Electron Devices > 2014 > 61 > 4 > 1022 - 1030
IEEE Transactions on Electron Devices > 2013 > 60 > 12 > 4125 - 4132
IEEE Electron Device Letters > 2013 > 34 > 9 > 1112 - 1114
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3132 - 3141
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3119 - 3131
IEEE Electron Device Letters > 2012 > 33 > 11 > 1550 - 1552
IEEE Electron Device Letters > 2011 > 32 > 11 > 1513 - 1515
IEEE Electron Device Letters > 2010 > 31 > 7 > 662 - 664
IEEE Electron Device Letters > 2008 > 29 > 4 > 287 - 289