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IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 187 - 193
IEEE Electron Device Letters > 2011 > 32 > 5 > 623 - 625
IEEE Electron Device Letters > 2009 > 30 > 12 > 1254 - 1256
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 272 - 276