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IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 199 - 206
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 9 > 1557 - 1570
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 610 - 616
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 8 > 2712 - 2725
2016 IEEE International Reliability Physics Symposium (IRPS) > 6C-2-1 - 6C-2-5
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 1274 - 1280
IEEE Transactions on Nanotechnology > 2016 > 15 > 2 > 274 - 280
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 474 - 477
IEEE Electron Device Letters > 2015 > 36 > 10 > 1030 - 1032
2015 IEEE International Reliability Physics Symposium > XT.4.1 - XT.4.4
2015 IEEE International Reliability Physics Symposium > 2F.1.1 - 2F.1.5
2015 IEEE International Reliability Physics Symposium > 3C.1.1 - 3C.1.7
IEEE Electron Device Letters > 2014 > 35 > 8 > 862 - 864
IEEE Transactions on Reliability > 2014 > 63 > 2 > 646 - 660
2013 IEEE International Reliability Physics Symposium (IRPS) > 3A.5.1 - 3A.5.7