Search results
IEEE Transactions on Magnetics > 2017 > 53 > 11 > 1 - 4
IEEE Transactions on Magnetics > 2017 > 53 > 11 > 1 - 4
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1421 - 1432
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1204 - 1214
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 213 - 220
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 1 > 122 - 132
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1754 - 1761
IEEE Transactions on Magnetics > 2016 > 52 > 4 > 1 - 10
IEEE Magnetics Letters > 2016 > 7 > 1 - 4
IEEE Transactions on Magnetics > 2015 > 51 > 12 > 1 - 13
IEEE Transactions on Magnetics > 2015 > 51 > 5 > 1 - 7
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1710 - 1716
IEEE Transactions on Magnetics > 2014 > 50 > 11 > 1 - 3
IEEE Transactions on Magnetics > 2014 > 50 > 8-2 > 1 - 7
IEEE Transactions on Magnetics > 2013 > 49 > 12 > 5620 - 5628
IEEE Transactions on Nanotechnology > 2013 > 12 > 6 > 971 - 977
IEEE Transactions on Magnetics > 2013 > 49 > 7 > 4343 - 4346
IEEE Transactions on Nanotechnology > 2012 > 11 > 1 > 63 - 70
IEEE Electron Device Letters > 2011 > 32 > 1 > 57 - 59
IEEE Transactions on Magnetics > 2010 > 46 > 6 > 2195 - 2197