Search results
IEEE Transactions on Magnetics > 2017 > 53 > 11 > 1 - 5
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4295 - 4301
IEEE Transactions on Magnetics > 2017 > 53 > 10 > 1 - 6
IEEE Transactions on Magnetics > 2017 > 53 > 10 > 1 - 13
IEEE Transactions on Magnetics > 2017 > 53 > 9 > 1 - 5
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1573 - 1577
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 213 - 220
IEEE Transactions on Magnetics > 2017 > 53 > 1 > 1 - 6
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 9 > 2851 - 2860
IEEE Transactions on Biomedical Circuits and Systems > 2016 > 10 > 4 > 828 - 836
IEEE Transactions on Magnetics > 2016 > 52 > 8 > 1 - 6
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1754 - 1761
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 3 > 380 - 393
IEEE Transactions on Magnetics > 2015 > 51 > 12 > 1 - 4
IEEE Transactions on Magnetics > 2015 > 51 > 12 > 1 - 13
IEEE Transactions on Nanotechnology > 2015 > 14 > 6 > 1024 - 1034
IEEE Transactions on Electron Devices > 2015 > 62 > 6 > 1769 - 1777
IEEE Transactions on Circuits and Systems I: Regular Papers > 2014 > 61 > 12 > 3376 - 3385
IEEE Electron Device Letters > 2014 > 35 > 4 > 488 - 490
IEEE Transactions on Electron Devices > 2013 > 60 > 9 > 2808 - 2814