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NEMI recommended Sn3.9Ag0.6Cu to replace the eutectic SnPb solder, but solder joints of this alloy have poor performance in reliability tests of electronic packages, especially the board level drop test. In this paper, the effect of Cu content in solder is studied on the interfacial reliability of SnAgCu solder joints on the Ni/Au plated pads. After preconditioning (three reflows post package assembly),...
Intermetallic compounds (IMCs) that grow on the interface between the solder alloy and its bonding pads play a crucial role in the reliability of solder joints. It has been identified that the cracking around the IMC layer is the primary failure mode in lead-free solder joints. Therefore the mechanical behavior of the IMC has attracted great attentions. In this paper, mechanical properties of two...
One of the driving factors for a steady reduction in wafer and cell thickness is the present shortage of polysilicon feedstock combined with the need to reduce manufacturing costs in photovoltaic module production. Therefore materials and manufacturing processes must adapt to maintain acceptable mechanical yields and module reliability. The soldering of solar cell strings is a critical step in the...
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