Search results
IEEE Electron Device Letters > 2017 > 38 > 10 > 1445 - 1448
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2893 - 2899
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2172 - 2178
IEEE Access > 2017 > 5 > 20946 - 20952
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2321 - 2327
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 5 > 1351 - 1358
IEEE Transactions on Electron Devices > 2015 > 62 > 8 > 2475 - 2480
IEEE Electron Device Letters > 2015 > 36 > 8 > 760 - 762
IEEE Electron Device Letters > 2015 > 36 > 7 > 660 - 662
IEEE Transactions on Electron Devices > 2015 > 62 > 5 > 1467 - 1472
IEEE Transactions on Electron Devices > 2015 > 62 > 5 > 1440 - 1447
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 405 - 413
IEEE Electron Device Letters > 2015 > 36 > 2 > 111 - 113
IEEE Photonics Technology Letters > 2015 > 27 > 2 > 117 - 120
IEEE Photonics Technology Letters > 2014 > 26 > 1 > 43 - 46
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2793 - 2801
IEEE Electron Device Letters > 2014 > 35 > 11 > 1127 - 1129
IEEE Journal of the Electron Devices Society > 2014 > 2 > 6 > 145 - 148
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3152 - 3158
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 978 - 982